rus
Issue #6/2021
I. V. Znamensky, E. O. Zot’ev, S. Yu. Yudin
Comparative Analysis of Threshold Sensitivity of IR-Systems in Different Spectral Range
Comparative Analysis of Threshold Sensitivity of IR-Systems in Different Spectral Range
DOI: 10.22184/1993-7296.FRos.2021.15.6.484.500
The result of calculating the threshold illumination of an optoelectronic system (OES) in various infrared sub-ranges in the range of 0.9–5.3 µm is presented. A technique has been developed and the illumination of the entrance pupil of the OES from the signal of the monitoring object (OM) of a cylindrical shape illuminated by the Sun and due to the intrinsic radiation of the OM surface is calculated. A program for energy calculation has been developed and its interface has been presented.
Tags: accumulation time atmosphere ir range matrix photodetector optoelectronic system overall brightness coefficient photon signal-to-noise ratio threshold illumination коэффициент габаритной яркости матричные фпу обзор космического пространства характеристики оптико-электронных систем
Subscribe to the journal Photonics Russia to read the full article.
The result of calculating the threshold illumination of an optoelectronic system (OES) in various infrared sub-ranges in the range of 0.9–5.3 µm is presented. A technique has been developed and the illumination of the entrance pupil of the OES from the signal of the monitoring object (OM) of a cylindrical shape illuminated by the Sun and due to the intrinsic radiation of the OM surface is calculated. A program for energy calculation has been developed and its interface has been presented.
Tags: accumulation time atmosphere ir range matrix photodetector optoelectronic system overall brightness coefficient photon signal-to-noise ratio threshold illumination коэффициент габаритной яркости матричные фпу обзор космического пространства характеристики оптико-электронных систем
Subscribe to the journal Photonics Russia to read the full article.
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